I. Overall objectives According to the overall deployment of the competent national authorities, combined with the overall objectives of the “Eleventh Five-Year Plan†period, establish a complete and scientific semiconductor lighting evaluation system framework, determine the main content, establish an evaluation body with legal qualifications and credibility, and measure, The hardware platform for testing and evaluation provides services for technical research, product evaluation, and technical ruling of the trading process. Through these services, the entire LED industry can be promoted to a good degree and promote sustainable development. II. Implementation Plan From June 2006 to June 2007, key technology research and equipment development for semiconductor lighting test platform were carried out according to testing standards. From March 2007 to December 2007, the key equipment development and design of the semiconductor lighting test platform were completed; the necessary equipment and equipment were purchased; the research and development of the test equipment was completed. Complete the construction of semiconductor lighting test platform. Third, the specific content and implementation plan (A), semiconductor lighting testing key technology research 1, overview Semiconductor lighting testing key technology research is a basic work of semiconductor lighting national inspection platform. If there is no objective and scientific test method, then the evaluation of the key technical research work done on the national testing platform lacks objectivity, and sometimes interferes with the normal progress of scientific research. The more serious situation is: not objective, Unscientific data can mislead the direction of science and technology. Due to the small scale of our country's enterprises, it is difficult for the detection optoelectronic experts to directly serve the company, and the inspection work is difficult to omit or skip. Therefore, test experts can only be engaged in the research of semiconductor lighting test methods outside the enterprise. The research on test methods in the national inspection platform for semiconductor lighting is not only necessary but also scientific and reasonable. It can make the research results directly serve the formulation of national standards, and also serve the relevant research institutions and enterprises through the platform. It is also a semiconductor lighting inspection platform. Construction provides a reference. This research is of great significance to the scientific and technological development of semiconductor lighting and the benign development of the industry. After the efforts of the "Tenth Five-Year Plan" period, China's semiconductor lighting has a certain foundation. At present, it is developing at a good time. The entire industry is in urgent need of a relatively complete theoretical guidance for test methods. Therefore, it started at the beginning of the national platform for semiconductor lighting. Testing key technology research work. 2, research content Test method research mainly includes five aspects:
(1) Photometry, colorimetry and radiosity testing technology research includes the following three aspects: 1 Power LED photometric parameter testing technology research 2 Power LED color parameter testing technology research 3 Power LED radiometric parameter testing technology Research (2), thermal (thermal resistance) testing technology research and research on the thermal field distribution characteristics of LED chips, the junction temperature of power LEDs and the heat dissipation capability test technology, providing criticality for LED package structure design and heat sink structure design Means of analysis. Including the following two aspects of research: 1 power LED temperature coefficient test technology research 2 power LED thermal parameter measurement technology research (3), power LED device long-term reliability research power LED device long-term reliability research in the national reports are different To study the long-term reliability test method of power LED devices with independent intellectual property rights in China, and provide reliability design data for enterprises, including the following three aspects: 1 Test technology research on power LED life expectancy (acceleration test) 2 Power LED mechanical strength And environmental adaptability test technology research 3 power LED quality assessment technology research (two), semiconductor lighting test equipment and equipment development (1), semiconductor lighting accelerated life test key equipment research research power type lighting LED high temperature life acceleration test method, LED High and low temperature reliability detection methods under various electric driving conditions. Develop an accelerated life test equipment for power LEDs, and quickly evaluate the life expectancy MTTF of LEDs for illumination by accelerated life test. Research content and main indicators: 1 Develop and develop power LED accelerated life test equipment with international advanced level. 2 Carry out a special study on power LED accelerated life test, explore the degradation law of LED, acceleration factor τ and activation energy AE, and extrapolate the expected life MTTF of LED through Alenis equation. (2) Development of semiconductor lighting thermal resistance test equipment Special research on thermal resistance test technology of semiconductor lighting LED devices, develop related thermal resistance test equipment to meet the requirements, solve the reliability screening problem of LED devices, and improve the reliability of LED products. Sex. Research content: Studying the thermal field distribution characteristics of LED chips, the test method of junction temperature and heat dissipation capability of power LEDs and the corresponding testing equipment, providing critical analysis means for LED package structure design and heat sink structure design. Research computer program-controlled data acquisition and timing control technology, and use this technology to achieve automatic test and calculation of LED thermal resistance, improve accuracy and test efficiency; study high-precision measurement and constant temperature control technology of reference point temperature of LED under test. Thermal resistance test equipment reaches the main indicators: 1 heating current supply range 0 ~ 5A; 2 thermal parameter measurement range 0-5V, uncertainty ≤ ± (0.6% + 3mV); 3 thermal resistance measurement uncertainty ≤ ± 2% . (III) Construction of semiconductor lighting test and evaluation system (including test platform, inspection and certification center, etc.) (1) Construction of test and evaluation system for semiconductor lighting packaged products According to the requirements of existing IEC for general lighting devices and national standards being developed According to the special optical, color, electrical, temperature and other properties of the LED device for lighting, the corresponding test platform is established for the research results of the detection technology of the LED device. Mainly have the following aspects: 1 luminosity, chromaticity and temperature performance of LED devices, radiation safety detection platform construction; 2 environmental adaptability test platform construction of LED devices; 3 mechanical strength test platform construction of LED devices; 4 LED devices Life accelerated test platform construction. Through the construction of the test platform, the company conducts fair and scientific parameter detection and reliability evaluation for the industrialized production of the packaged products, ensuring the reliable quality of the semiconductor lighting products entering the market; providing objective and impartial test reports and quality for the national regulatory authorities. Reliability information. Provide services for the formulation and improvement of standard systems, and improve the research, design and application level of LED lighting devices in China. Form a group of lighting LED device products with independent intellectual property rights and adapt to the rules of the international market. Achieve the ability to simultaneously accommodate more than 10,000 lighting devices; annual detection capacity of 300
(1) Photometry, colorimetry and radiosity testing technology research includes the following three aspects: 1 Power LED photometric parameter testing technology research 2 Power LED color parameter testing technology research 3 Power LED radiometric parameter testing technology Research (2), thermal (thermal resistance) testing technology research and research on the thermal field distribution characteristics of LED chips, the junction temperature of power LEDs and the heat dissipation capability test technology, providing criticality for LED package structure design and heat sink structure design Means of analysis. Including the following two aspects of research: 1 power LED temperature coefficient test technology research 2 power LED thermal parameter measurement technology research (3), power LED device long-term reliability research power LED device long-term reliability research in the national reports are different To study the long-term reliability test method of power LED devices with independent intellectual property rights in China, and provide reliability design data for enterprises, including the following three aspects: 1 Test technology research on power LED life expectancy (acceleration test) 2 Power LED mechanical strength And environmental adaptability test technology research 3 power LED quality assessment technology research (two), semiconductor lighting test equipment and equipment development (1), semiconductor lighting accelerated life test key equipment research research power type lighting LED high temperature life acceleration test method, LED High and low temperature reliability detection methods under various electric driving conditions. Develop an accelerated life test equipment for power LEDs, and quickly evaluate the life expectancy MTTF of LEDs for illumination by accelerated life test. Research content and main indicators: 1 Develop and develop power LED accelerated life test equipment with international advanced level. 2 Carry out a special study on power LED accelerated life test, explore the degradation law of LED, acceleration factor τ and activation energy AE, and extrapolate the expected life MTTF of LED through Alenis equation. (2) Development of semiconductor lighting thermal resistance test equipment Special research on thermal resistance test technology of semiconductor lighting LED devices, develop related thermal resistance test equipment to meet the requirements, solve the reliability screening problem of LED devices, and improve the reliability of LED products. Sex. Research content: Studying the thermal field distribution characteristics of LED chips, the test method of junction temperature and heat dissipation capability of power LEDs and the corresponding testing equipment, providing critical analysis means for LED package structure design and heat sink structure design. Research computer program-controlled data acquisition and timing control technology, and use this technology to achieve automatic test and calculation of LED thermal resistance, improve accuracy and test efficiency; study high-precision measurement and constant temperature control technology of reference point temperature of LED under test. Thermal resistance test equipment reaches the main indicators: 1 heating current supply range 0 ~ 5A; 2 thermal parameter measurement range 0-5V, uncertainty ≤ ± (0.6% + 3mV); 3 thermal resistance measurement uncertainty ≤ ± 2% . (III) Construction of semiconductor lighting test and evaluation system (including test platform, inspection and certification center, etc.) (1) Construction of test and evaluation system for semiconductor lighting packaged products According to the requirements of existing IEC for general lighting devices and national standards being developed According to the special optical, color, electrical, temperature and other properties of the LED device for lighting, the corresponding test platform is established for the research results of the detection technology of the LED device. Mainly have the following aspects: 1 luminosity, chromaticity and temperature performance of LED devices, radiation safety detection platform construction; 2 environmental adaptability test platform construction of LED devices; 3 mechanical strength test platform construction of LED devices; 4 LED devices Life accelerated test platform construction. Through the construction of the test platform, the company conducts fair and scientific parameter detection and reliability evaluation for the industrialized production of the packaged products, ensuring the reliable quality of the semiconductor lighting products entering the market; providing objective and impartial test reports and quality for the national regulatory authorities. Reliability information. Provide services for the formulation and improvement of standard systems, and improve the research, design and application level of LED lighting devices in China. Form a group of lighting LED device products with independent intellectual property rights and adapt to the rules of the international market. Achieve the ability to simultaneously accommodate more than 10,000 lighting devices; annual detection capacity of 300
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